Growth of zinc sulfide thin films with the successive ionic layer adsorption and reaction method as studied by atomic force microscopy

T. Kanniainen, S. Lindroos, T. Prohaska, G. Friedbacher, M. Leskelä, M. Grasserbauer, L. Niinistö

    Research output: Contribution to journalArticleScientificpeer-review

    24 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)985-989
    JournalJournal of Materials Chemistry
    Volume5
    Publication statusPublished - 1995
    MoE publication typeA1 Journal article-refereed

    Keywords

    • AFM
    • atomic force microscopy
    • growth
    • thin film
    • zinc sulfide

    Cite this