Abstract
Ferroelectric tunnel junctions have opened up promising routes towards energy-efficient data storage applications and memristive devices [1]. Polarization reversal in a ferroelectric tunnel barrier can change the electrical resistance of a junction, a phenomenon known as tunneling electroresistance (TER). On the other hand, redox-based effects such as the migration of oxygen vacancies can cause large resistive switching in transition metal oxides [2]. Here, we demonstrate nearly identical switching behavior in nominally symmetric tunnel junctions that are comprised of two La2/3Sr1/3M-nO3 (LSMO) electrodes separated by a ferroelectric PbZr0.2Ti0.8O3 (PZT) or BaTiO3 (BTO) tunnel barrier, or a paraelectric SrTiO3 (STO) tunnel barrier. The tunnel junctions were grown by pulsed laser deposition and patterned into solid junctions with a lateral dimension of 20 × 40 μm2, 30 × 60 μm2, and 40 × 80 μm2. Moreover, LSMO/PZT and LSMO/BTO bilayer were patterned into Hall bar structures for in-plane electric transport measurements inside a scanning probe microscope.
Original language | English |
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Title of host publication | 2015 IEEE International Magnetics Conference, INTERMAG 2015 |
Publisher | IEEE |
ISBN (Electronic) | 9781479973224 |
DOIs | |
Publication status | Published - 14 Jul 2015 |
MoE publication type | A4 Conference publication |
Event | IEEE International Magnetics Conference - Beijing, China Duration: 11 May 2015 → 15 May 2015 |
Conference
Conference | IEEE International Magnetics Conference |
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Abbreviated title | INTERMAG |
Country/Territory | China |
City | Beijing |
Period | 11/05/2015 → 15/05/2015 |