Genetic optimization algorithms in the design of coupled SAW filters

Johanna Meltaus; Perttu Hämäläinen; Victor P. Plessky; Martti M. Salomaa

Genetic optimization algorithms in the design of coupled SAW filters

Johanna Meltaus, Perttu Hämäläinen, Victor P. Plessky, Martti M. Salomaa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Original language	English
Title of host publication	IEEE International Ultrasonics, Ferroelectrics, and Frequency Control Joint 50th Anniversary Conference, Montréal, Kanada, 23-27.8.2004
Publisher	IEEE
Pages	1901
Publication status	Published - 2005
MoE publication type	A4 Article in a conference publication

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@inproceedings{37a15b4980634dde8708d6112ba77b53,

title = "Genetic optimization algorithms in the design of coupled SAW filters",

author = "Johanna Meltaus and Perttu H{\"a}m{\"a}l{\"a}inen and Plessky, {Victor P.} and Salomaa, {Martti M.}",

year = "2005",

language = "English",

pages = "1901",

booktitle = "IEEE International Ultrasonics, Ferroelectrics, and Frequency Control Joint 50th Anniversary Conference, Montr{\'e}al, Kanada, 23-27.8.2004",

publisher = "IEEE",

address = "United States",

}

Genetic optimization algorithms in the design of coupled SAW filters. / Meltaus, Johanna; Hämäläinen, Perttu; Plessky, Victor P. et al.
IEEE International Ultrasonics, Ferroelectrics, and Frequency Control Joint 50th Anniversary Conference, Montréal, Kanada, 23-27.8.2004. IEEE, 2005. p. 1901.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Genetic optimization algorithms in the design of coupled SAW filters

AU - Meltaus, Johanna

AU - Hämäläinen, Perttu

AU - Plessky, Victor P.

AU - Salomaa, Martti M.

PY - 2005

Y1 - 2005

M3 - Conference contribution

SP - 1901

BT - IEEE International Ultrasonics, Ferroelectrics, and Frequency Control Joint 50th Anniversary Conference, Montréal, Kanada, 23-27.8.2004

PB - IEEE

ER -