@techreport{755e8515e8c04e689edd8b0fe236bdb9,
title = "Fringe pattern of the Fizeau interferometer",
keywords = "diffraction, finite aperture, interference wedge, interferometry, self-imaging, walk-off effect, diffraction, finite aperture, interference wedge, interferometry, self-imaging, walk-off effect, diffraction, finite aperture, interference wedge, interferometry, self-imaging, walk-off effect",
author = "H. Lauranto and T. Kajava and A. Friberg",
year = "1995",
language = "English",
series = "XXIX Annual Conference of the Finnish Physical Society, Jyv{\"a}skyl{\"a}, March 16-18, 1995",
publisher = "The Finnish Physical Society",
pages = "5",
type = "WorkingPaper",
institution = "The Finnish Physical Society",
}