Framework for Faster-Than-Real-Time Testing of IEC 61499 Applications with Embedded Process Simulation

Valeriy Vyatkin, Roman Rumiantsev

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Downloads (Pure)

Abstract

This paper presents a novel framework for testing automation applications compliant with the international standard IEC 61499 and including process simulation. The framework enables automation programs to be run in testing mode faster than real time, validated by an external tester program. Application of the approach is illustrated on example of a simple component-based system.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE 22nd International Conference on Industrial Informatics, INDIN 2024
PublisherIEEE
Number of pages5
ISBN (Electronic)979-8-3315-2747-1
DOIs
Publication statusPublished - 2024
MoE publication typeA4 Conference publication
EventIEEE International Conference on Industrial Informatics - Beijing, China
Duration: 17 Aug 202420 Aug 2024

Publication series

NameIEEE International Conference on Industrial Informatics
ISSN (Electronic)2378-363X

Conference

ConferenceIEEE International Conference on Industrial Informatics
Country/TerritoryChina
CityBeijing
Period17/08/202420/08/2024

Keywords

  • Automatic testing
  • Faster-than-real-time simulation
  • IEC 61499
  • Simulation in the loop

Fingerprint

Dive into the research topics of 'Framework for Faster-Than-Real-Time Testing of IEC 61499 Applications with Embedded Process Simulation'. Together they form a unique fingerprint.

Cite this