Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry

V.T. Rangel-Kuoppa, M. Sopanen, H. Lipsanen

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)45-54
Number of pages10
JournalJOURNAL OF NANO RESEARCH
Volume12
DOIs
Publication statusPublished - Dec 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • capacitance voltage
  • coplanar geometry
  • distributed network
  • GaAs
  • schottky contact

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