Formal Modeling of Testing Software for Cyber-Physical Automation Systems

Igor Buzhinsky; Cheng Pang; Valeriy Vyatkin

doi:10.1109/Trustcom.2015.648

Formal Modeling of Testing Software for Cyber-Physical Automation Systems

Igor Buzhinsky, Cheng Pang, Valeriy Vyatkin

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

12 Citations (Scopus)

Original language	English
Title of host publication	IEEE International Symposium on Parallel and Distributed Processing with Applications (IEEE ISPA-15), Helsinki, Finland, August 2022, 2015
Pages	301-306
DOIs	https://doi.org/10.1109/Trustcom.2015.648
Publication status	Published - 2015
MoE publication type	A4 Conference publication

Publication series

Name
ISSN (Print)	1935-4576

Access to Document

10.1109/Trustcom.2015.648

Cite this

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title = "Formal Modeling of Testing Software for Cyber-Physical Automation Systems",

author = "Igor Buzhinsky and Cheng Pang and Valeriy Vyatkin",

year = "2015",

doi = "10.1109/Trustcom.2015.648",

language = "English",

pages = "301--306",

booktitle = "IEEE International Symposium on Parallel and Distributed Processing with Applications (IEEE ISPA-15), Helsinki, Finland, August 2022, 2015",

}

Formal Modeling of Testing Software for Cyber-Physical Automation Systems. / Buzhinsky, Igor; Pang, Cheng; Vyatkin, Valeriy.
IEEE International Symposium on Parallel and Distributed Processing with Applications (IEEE ISPA-15), Helsinki, Finland, August 2022, 2015. 2015. p. 301-306.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Formal Modeling of Testing Software for Cyber-Physical Automation Systems

AU - Buzhinsky, Igor

AU - Pang, Cheng

AU - Vyatkin, Valeriy

PY - 2015

Y1 - 2015

U2 - 10.1109/Trustcom.2015.648

DO - 10.1109/Trustcom.2015.648

M3 - Conference article in proceedings

SP - 301

EP - 306

BT - IEEE International Symposium on Parallel and Distributed Processing with Applications (IEEE ISPA-15), Helsinki, Finland, August 2022, 2015

ER -