Flow patterns and microdefects in silicon

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific › peer-review

Original language	English
Title of host publication	HASYLAB-DESY Annual Report 1995
Pages	697-698
Publication status	Published - 1996
MoE publication type	A3 Book section, Chapters in research books

Keywords

@inbook{311b3f05040246cdadcce2b540f57a7d,

title = "Flow patterns and microdefects in silicon",

keywords = "optoelectronics, semiconductors, optoelectronics, semiconductors, optoelectronics, semiconductors",

author = "T. Tuomi and M. Taskinen and R. Rantam{\"a}ki and P. McNally and A. Danilewsky and M. Schweizer and J. Molarius and M. Tilli",

year = "1996",

language = "English",

pages = "697--698",

booktitle = "HASYLAB-DESY Annual Report 1995",

}

TY - CHAP

T1 - Flow patterns and microdefects in silicon

AU - Tuomi, T.

AU - Taskinen, M.

AU - Rantamäki, R.

AU - McNally, P.

AU - Danilewsky, A.

AU - Schweizer, M.

AU - Molarius, J.

AU - Tilli, M.

PY - 1996

Y1 - 1996

KW - optoelectronics

KW - semiconductors

KW - optoelectronics

KW - semiconductors

KW - optoelectronics

KW - semiconductors

M3 - Chapter

SP - 697

EP - 698

BT - HASYLAB-DESY Annual Report 1995

ER -