Fast Wafer-Level Characterization of Silicon Photodetectors by Photoluminescence Imaging

Hussein Ayedh^*, Wisa Förbom, Juha Heinonen, Ismo T. S. Heikkinen, Marko Yli-Koski, Ville Vähänissi, Hele Savin

^*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

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NanoWires: High throughput metrology for nanowire energy harvesting devices
Savin, H., Chen, K. & Pasanen, T.
01/09/2020 → 31/08/2023
Project: EU other competitive funding (ERA-NET, EURAMET, EUREKA, EU JU)
NIR: Super-sensitive gamma/X- and NIR-radiation detectors via defect-free nanostructures: Next Imaging Revolution?
Vähänissi, V., Savin, H., Ayedh, H., Setälä, O. & Radfar, B.
01/09/2020 → 31/08/2024
Project: Academy of Finland: Other research funding