Fast Wafer-Level Characterization of Silicon Photodetectors by Photoluminescence Imaging

Hussein Ayedh*, Wisa Förbom, Juha Heinonen, Ismo T. S. Heikkinen, Marko Yli-Koski, Ville Vähänissi, Hele Savin

*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

2 Citations (Scopus)
83 Downloads (Pure)

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