Original language | English |
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Pages (from-to) | 969-976 |
Journal | Journal of Electronic Materials |
Volume | 34 |
Issue number | 7 |
Publication status | Published - 2005 |
MoE publication type | A1 Journal article-refereed |
Failure Mechanisms of Lead-free Chip Scale Package Interconnections Under Fast Mechanical Loading
Toni Mattila, Jorma Kivilahti
Research output: Contribution to journal › Article › Scientific › peer-review
78
Citations
(Scopus)