Failure analysis of LED arrays using white beam synchrotron x-ray topography

D. Lowney, P.J. McNally, M. "O'Hare", P.A.F. Herbert, T. Tuomi, R. Rantamäki, M. Karilahti, A.N. Danilewsky

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication3rd Int. Conf. on Materials for Microelectronics (MFM2000), Dublin Castle, Ireland, 16-17 October, 2000
    Pages37-41
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication

    Keywords

    • failure analysis
    • light-emitting diodes
    • synchrotron x-ray topography

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