Experimental study of Evanohm thin film resistors at sub Kelvin temperatures

A.F Satrapinski, Alexande Savin, S. Novikov, O. Hahtela

    Research output: Contribution to journalArticleScientificpeer-review

    4 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)055102
    JournalMeasurement Science and Technology
    Volume19
    Publication statusPublished - 2008
    MoE publication typeA1 Journal article-refereed

    Keywords

    • low temperature
    • resistivity
    • thin film resistor

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