Experimental study of Evanohm thin film resistors at sub Kelvin temperatures

A.F Satrapinski; Alexande Savin; S. Novikov; O. Hahtela

Experimental study of Evanohm thin film resistors at sub Kelvin temperatures

A.F Satrapinski, Alexande Savin, S. Novikov, O. Hahtela

Research output: Contribution to journal › Article › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Pages (from-to)	055102
Journal	Measurement Science and Technology
Volume	19
Publication status	Published - 2008
MoE publication type	A1 Journal article-refereed

Keywords

low temperature
resistivity
thin film resistor

Cite this

@article{950f5e26090c408c8d4bf89de087d1a3,

title = "Experimental study of Evanohm thin film resistors at sub Kelvin temperatures",

keywords = "low temperature, resistivity, thin film resistor, low temperature, resistivity, thin film resistor, low temperature, resistivity, thin film resistor",

author = "A.F Satrapinski and Alexande Savin and S. Novikov and O. Hahtela",

year = "2008",

language = "English",

volume = "19",

pages = "055102",

journal = "Measurement Science and Technology",

issn = "0957-0233",

publisher = "IOP Publishing Ltd.",

}

TY - JOUR

T1 - Experimental study of Evanohm thin film resistors at sub Kelvin temperatures

AU - Satrapinski, A.F

AU - Savin, Alexande

AU - Novikov, S.

AU - Hahtela, O.

PY - 2008

Y1 - 2008

KW - low temperature

KW - resistivity

KW - thin film resistor

KW - low temperature

KW - resistivity

KW - thin film resistor

KW - low temperature

KW - resistivity

KW - thin film resistor

M3 - Article

VL - 19

SP - 055102

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

ER -