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Experimental evidence on removing copper and light-induced degradation from silicon by negative charge

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)
88 Downloads (Pure)
Original languageEnglish
JournalApplied Physics Letters
Volume105
Issue number105
DOIs
Publication statusPublished - 2014
MoE publication typeA1 Journal article-refereed

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