Experimental Determination of the Loss Mechanisms in a Mobile Handset Chassis

C. Icheln, P. Vainikainen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationIEEE Instrumentation and Measurement Technology Conference, Budapest, Hungary, May 21-23, 2001
    Place of PublicationBudapest, Hungary
    Publication statusPublished - 2001
    MoE publication typeA4 Article in a conference publication


    • chassis modes
    • chassis resonance
    • efficiency measurements
    • mobile handsets
    • radiation efficiency

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