Experimental determination of secondary fluorescence range

E. Heikinheimo, E. Valovirta, X. Llovet

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationPraha
    Pages230
    Publication statusPublished - 2000
    MoE publication typeD4 Published development or research report or study

    Publication series

    Name4th Regional Worksop of EMAS, Electron probe microanalysis in materials science - Practical aspectes, Trest, Czech Republic, 17-20 May, 2000
    PublisherEuropean Microbeam Analysis Society

    Keywords

    • electron probe microanalysis
    • phase boundaries
    • secondary fluorescence

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