@techreport{ca79709169544fd7a957f1674fdc5d89,
title = "Experimental determination of secondary fluorescence range",
keywords = "electron probe microanalysis, phase boundaries, secondary fluorescence, electron probe microanalysis, phase boundaries, secondary fluorescence, electron probe microanalysis, phase boundaries, secondary fluorescence",
author = "E. Heikinheimo and E. Valovirta and X. Llovet",
year = "2000",
language = "English",
series = "4th Regional Worksop of EMAS, Electron probe microanalysis in materials science - Practical aspectes, Trest, Czech Republic, 17-20 May, 2000",
publisher = "European Microbeam Analysis Society",
pages = "230",
type = "WorkingPaper",
institution = "European Microbeam Analysis Society",
}