Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy

Research output: Contribution to journalArticle


  • D. Lowney
  • P.J. McNally
  • M. O´Hare
  • P.A.F. Herbert
  • T. Tuomi
  • R. Rantamäki
  • M. Karilahti
  • A.N. Danilewsky

Research units


Original languageEnglish
Pages (from-to)249-253
JournalJournal of Materials Science: Materials in Electronics
Publication statusPublished - 2001
MoE publication typeA1 Journal article-refereed

    Research areas

  • light emitting diodes, synchrotron topography

ID: 4149500