Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy

D. Lowney, P.J. McNally, M. O´Hare, P.A.F. Herbert, T. Tuomi, R. Rantamäki, M. Karilahti, A.N. Danilewsky

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)249-253
    JournalJournal of Materials Science: Materials in Electronics
    Volume12
    Publication statusPublished - 2001
    MoE publication typeA1 Journal article-refereed

    Keywords

    • light emitting diodes
    • synchrotron topography

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