Examination of the quality of beta-FeSi2 Heteroepitaxy on silicon substrates using synchrotron X-Ray topography & X-Ray excited luminescence

Patric J. McNally, Lisa "O'Reilly", Turkka O. Tuomi, Aapo Lankinen, Antti Säynätjoki, Andreas Danilewsky, H. Udono

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    Original languageEnglish
    Title of host publicationHASYLAB Annual Report 2006 Part I
    Place of PublicationHamburg, Germany
    PublisherHamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Eletronen-synchrotron DESY
    Pages531-532
    Publication statusPublished - 2007
    MoE publication typeA3 Part of a book or another research book

    Keywords

    • FeSi2
    • heteroepitaxy
    • synchrotron topography
    • XEOL

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