EXAFS study of thulium doped zinc sulfide thin films

Y. Charreire, O. Tolonen-Kivimäki, M. Leskelä, R. Cortes, E. Nykänen, P. Soininen, L. Niinistö

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationJyväskylä
    Publication statusPublished - 1994
    MoE publication typeD4 Published development or research report or study

    Publication series

    Name2nd International Conference on f-Elements, ICFE-2, Programme and Abstracts, Helsinki, 1.-6.8.1994


    • exafs
    • structure
    • thin film
    • thulium
    • zinc sulfide

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