Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures

C. Da Viá, W. Bell, P. Berglund

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication1988 Nuclear Science Symposium and Medical Imaging Conference, Toronto, Canada,8.10.-14.10.1998
    Pagess.1-3
    Publication statusPublished - 1998
    MoE publication typeA4 Article in a conference publication

    Keywords

    • radiation damage

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