Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography

Henri Jussila, Nagarajan Subramaniyam, Sakari Sintonen, Sami Suihkonen, Aapo Lankinen, Teppo Huhtio, Carsten Paulmann, Harri Lipsanen, Turkka Tuomi, Markku Sopanen

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