Original language | English |
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Pages (from-to) | 680-684 |
Number of pages | 5 |
Journal | Thin Solid Films |
Volume | 534 |
DOIs | |
Publication status | Published - 1 May 2013 |
MoE publication type | A1 Journal article-refereed |
Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography
Henri Jussila, Nagarajan Subramaniyam, Sakari Sintonen, Sami Suihkonen, Aapo Lankinen, Teppo Huhtio, Carsten Paulmann, Harri Lipsanen, Turkka Tuomi, Markku Sopanen
Research output: Contribution to journal › Article › Scientific › peer-review
4
Citations
(Scopus)