Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography

Henri Jussila, Nagarajan Subramaniyam, Sakari Sintonen, Sami Suihkonen, Aapo Lankinen, Teppo Huhtio, Carsten Paulmann, Harri Lipsanen, Turkka Tuomi, Markku Sopanen

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)680-684
Number of pages5
JournalThin Solid Films
Publication statusPublished - 1 May 2013
MoE publication typeA1 Journal article-refereed

Cite this