This paper introduces the concept of a process capability matrix - an ordered set of dimensionless parameters that capture information on a manufacturing system's response to disturbances. The matrix is similar to the process capability indices Cp, and Cpk, but is extended to multiple acceptance criteria and multiple causes of variation. Equations are presented that use the matrix to estimate yield in manufacture of products with multiple acceptance criteria. The surface mount of large body electronic packages serves as an example of the effectiveness of the process capability matrix as a tool for design decision making.
|Number of pages||7|
|Journal||JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING: TRANSACTIONS OF THE ASME|
|Publication status||Published - Aug 2000|
|MoE publication type||A1 Journal article-refereed|