Erratum: Structural, optical, and electrical properties of orthorhombic κ -(InxGa1-x)2O3 thin films (APL Materials (2019) 7 (022525) DOI: 10.1063/1.5054394)

A. Hassa, H. Von Wenckstern, D. Splith, C. Sturm, M. Kneiß, V. Prozheeva, M. Grundmann

Research output: Other contributionScientificpeer-review

Abstract

Due to a misassignment of EDX and XRD data of the electrically conducting Zr-doped sample, electrical transport data and properties of Schottky barrier diodes reported in the original article1 were determined for a sample having monoclinic β-gallia structure. The data as well as its analysis are valid; however, it must be attributed to the monoclinic β-phase instead of the orthorhombic κ-phase. The structural and optical data of the ternary κ-(InxGa1-x)2O3 thin film with lateral spread of the cation composition are valid, and this erratum does not affect these results nor their interpretation.

Original languageEnglish
PublisherAmerican Institute of Physics
DOIs
Publication statusPublished - 1 Jul 2019
MoE publication typeNot Eligible

Publication series

NameAPL Materials
PublisherAMERICAN INSTITUTE OF PHYSICS
ISSN (Print)2166-532X

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