Emanation thermal analysis in the characterization of zinc sulfide thin films prepared from different precursors

V. Balek, J. Fusek, O. Kriz, M. Leskelä, L. Niinistö, E. Nykänen, J. Rautanen, P. Soininen

    Research output: Contribution to journalArticleScientificpeer-review

    12 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)119-124
    JournalJournal of Materials Research
    Volume9
    Publication statusPublished - 1994
    MoE publication typeA1 Journal article-refereed

    Keywords

    • atomic layer epitaxy (ALE)
    • emanation thermal analysis
    • thin films
    • zinc sulfide

    Cite this