Electronic Transport Properties of Layered Antiferromagnet CuCrS2

Girish C. Tewari*, Pavan Kumar, T. S. Tripathi, A.K. Rastogi

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

1 Citation (Scopus)


Antiferromagnetic layered compound CuCrS2 has been prepared in single phase. Structural details with x-ray diffraction and electronic transport properties from 15 to 300 K have been studied. X-ray diffraction with reitveld refinement gave significant concentration of Cr occupying inter-layer octahedral site. Antiferromagnetism is marginally affected by chromium disorder. The electrical resistivity in polycrystalline pellet shows non-metallic non-insulating behavior while the single crystal flake is metallic. We interpret the temperature dependence of electrical resistivity and thermoelectric power due to the localization of carriers and the formation of magnetic polarons in the paramagnetic phase of CuCrS2 due to the Cr disorder.

Original languageEnglish
Title of host publicationSolid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010
EditorsAB Garg, R Mittal, R Mukhopadhyay
PublisherAmerican Institute of Physics
Number of pages2
EditionPART A
ISBN (Print)9780735409057
Publication statusPublished - 12 Sep 2011
MoE publication typeA4 Article in a conference publication
EventDAE Solid State Physics Symposium - Manipal, India
Duration: 26 Dec 201030 Dec 2010
Conference number: 55

Publication series

NameAIP Conference Proceedings
NumberPART A
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


ConferenceDAE Solid State Physics Symposium
Abbreviated titleSSPS


  • Crystallographic defects
  • thermoelectric power
  • magnetic Polarons


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