Electronic Transport Properties of Layered Antiferromagnet CuCrS2

Girish C. Tewari; Pavan Kumar; T. S. Tripathi; A.K. Rastogi

doi:10.1063/1.3606227

Electronic Transport Properties of Layered Antiferromagnet CuCrS2

Girish C. Tewari^*, Pavan Kumar, T. S. Tripathi, A.K. Rastogi

^*Corresponding author for this work

Not published at Aalto University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Abstract

Antiferromagnetic layered compound CuCrS₂ has been prepared in single phase. Structural details with x-ray diffraction and electronic transport properties from 15 to 300 K have been studied. X-ray diffraction with reitveld refinement gave significant concentration of Cr occupying inter-layer octahedral site. Antiferromagnetism is marginally affected by chromium disorder. The electrical resistivity in polycrystalline pellet shows non-metallic non-insulating behavior while the single crystal flake is metallic. We interpret the temperature dependence of electrical resistivity and thermoelectric power due to the localization of carriers and the formation of magnetic polarons in the paramagnetic phase of CuCrS₂ due to the Cr disorder.

Original language	English
Title of host publication	Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010
Editors	AB Garg, R Mittal, R Mukhopadhyay
Publisher	American Institute of Physics
Pages	1059-1060
Number of pages	2
Edition	PART A
ISBN (Print)	9780735409057
DOIs	https://doi.org/10.1063/1.3606227
Publication status	Published - 12 Sep 2011
MoE publication type	A4 Article in a conference publication
Event	DAE Solid State Physics Symposium - Manipal, India Duration: 26 Dec 2010 → 30 Dec 2010 Conference number: 55

Publication series

Name	AIP Conference Proceedings
Number	PART A
Volume	1349
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	DAE Solid State Physics Symposium
Abbreviated title	SSPS
Country/Territory	India
City	Manipal
Period	26/12/2010 → 30/12/2010

Keywords

Crystallographic defects
thermoelectric power
magnetic Polarons
SELENIDES
SULFIDES

Access to Document

10.1063/1.3606227

SFX availability

Full text

Cite this

Tewari, G. C., Kumar, P., Tripathi, T. S., & Rastogi, A. K. (2011). Electronic Transport Properties of Layered Antiferromagnet CuCrS2. In AB. Garg, R. Mittal, & R. Mukhopadhyay (Eds.), Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010 (PART A ed., pp. 1059-1060). (AIP Conference Proceedings; Vol. 1349, No. PART A). American Institute of Physics. https://doi.org/10.1063/1.3606227

@inproceedings{5031c1c1f03342c7bc4688ca462515dc,

title = "Electronic Transport Properties of Layered Antiferromagnet CuCrS2",

abstract = "Antiferromagnetic layered compound CuCrS2 has been prepared in single phase. Structural details with x-ray diffraction and electronic transport properties from 15 to 300 K have been studied. X-ray diffraction with reitveld refinement gave significant concentration of Cr occupying inter-layer octahedral site. Antiferromagnetism is marginally affected by chromium disorder. The electrical resistivity in polycrystalline pellet shows non-metallic non-insulating behavior while the single crystal flake is metallic. We interpret the temperature dependence of electrical resistivity and thermoelectric power due to the localization of carriers and the formation of magnetic polarons in the paramagnetic phase of CuCrS2 due to the Cr disorder.",

keywords = "Crystallographic defects, thermoelectric power, magnetic Polarons, SELENIDES, SULFIDES",

author = "Tewari, {Girish C.} and Pavan Kumar and Tripathi, {T. S.} and A.K. Rastogi",

year = "2011",

month = sep,

day = "12",

doi = "10.1063/1.3606227",

language = "English",

isbn = "9780735409057",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics",

number = "PART A",

pages = "1059--1060",

editor = "AB Garg and R Mittal and R Mukhopadhyay",

booktitle = "Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010",

address = "United States",

edition = "PART A",

note = "DAE Solid State Physics Symposium, SSPS ; Conference date: 26-12-2010 Through 30-12-2010",

}

Tewari, GC, Kumar, P, Tripathi, TS & Rastogi, AK 2011, Electronic Transport Properties of Layered Antiferromagnet CuCrS2. in AB Garg, R Mittal & R Mukhopadhyay (eds), Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. PART A edn, AIP Conference Proceedings, no. PART A, vol. 1349, American Institute of Physics, pp. 1059-1060, DAE Solid State Physics Symposium, Manipal, India, 26/12/2010. https://doi.org/10.1063/1.3606227

Electronic Transport Properties of Layered Antiferromagnet CuCrS2. / Tewari, Girish C.; Kumar, Pavan; Tripathi, T. S. et al.

Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. ed. / AB Garg; R Mittal; R Mukhopadhyay. PART A. ed. American Institute of Physics, 2011. p. 1059-1060 (AIP Conference Proceedings; Vol. 1349, No. PART A).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Electronic Transport Properties of Layered Antiferromagnet CuCrS2

AU - Tewari, Girish C.

AU - Kumar, Pavan

AU - Tripathi, T. S.

AU - Rastogi, A.K.

N1 - Conference code: 55

PY - 2011/9/12

Y1 - 2011/9/12

N2 - Antiferromagnetic layered compound CuCrS2 has been prepared in single phase. Structural details with x-ray diffraction and electronic transport properties from 15 to 300 K have been studied. X-ray diffraction with reitveld refinement gave significant concentration of Cr occupying inter-layer octahedral site. Antiferromagnetism is marginally affected by chromium disorder. The electrical resistivity in polycrystalline pellet shows non-metallic non-insulating behavior while the single crystal flake is metallic. We interpret the temperature dependence of electrical resistivity and thermoelectric power due to the localization of carriers and the formation of magnetic polarons in the paramagnetic phase of CuCrS2 due to the Cr disorder.

AB - Antiferromagnetic layered compound CuCrS2 has been prepared in single phase. Structural details with x-ray diffraction and electronic transport properties from 15 to 300 K have been studied. X-ray diffraction with reitveld refinement gave significant concentration of Cr occupying inter-layer octahedral site. Antiferromagnetism is marginally affected by chromium disorder. The electrical resistivity in polycrystalline pellet shows non-metallic non-insulating behavior while the single crystal flake is metallic. We interpret the temperature dependence of electrical resistivity and thermoelectric power due to the localization of carriers and the formation of magnetic polarons in the paramagnetic phase of CuCrS2 due to the Cr disorder.

KW - Crystallographic defects

KW - thermoelectric power

KW - magnetic Polarons

KW - SELENIDES

KW - SULFIDES

UR - http://www.scopus.com/inward/record.url?scp=80052455929&partnerID=8YFLogxK

U2 - 10.1063/1.3606227

DO - 10.1063/1.3606227

M3 - Conference contribution

SN - 9780735409057

T3 - AIP Conference Proceedings

SP - 1059

EP - 1060

BT - Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010

A2 - Garg, AB

A2 - Mittal, R

A2 - Mukhopadhyay, R

PB - American Institute of Physics

T2 - DAE Solid State Physics Symposium

Y2 - 26 December 2010 through 30 December 2010

ER -

Tewari GC, Kumar P, Tripathi TS, Rastogi AK. Electronic Transport Properties of Layered Antiferromagnet CuCrS2. In Garg AB, Mittal R, Mukhopadhyay R, editors, Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. PART A ed. American Institute of Physics. 2011. p. 1059-1060. (AIP Conference Proceedings; PART A). https://doi.org/10.1063/1.3606227

Electronic Transport Properties of Layered Antiferromagnet CuCrS2

Abstract

Publication series

Conference

Keywords

Access to Document

SFX availability

Other files and links

Fingerprint

Cite this