| Original language | English |
|---|---|
| Publication status | Published - 6 Feb 2017 |
Keywords
- electron beam microanalysis
- X-rays
- L-lines
Electron probe microanalysis of transition metal compounds using L-lines: Invited lecture
X. Llovet, P.T. Pinard, E. Heikinheimo, S. Richter
Research output: Contribution to conference › Poster › Scientific › peer-review