Electron probe microanalysis of transition metal compounds using L-lines: Invited lecture

X. Llovet, P.T. Pinard, E. Heikinheimo, S. Richter

Research output: Contribution to conferencePosterScientificpeer-review

Original languageEnglish
Publication statusPublished - 6 Feb 2017

Keywords

  • electron beam microanalysis
  • X-rays
  • L-lines

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