Electromigration Induced Failure in Passivated Aluminium Based Metallizations - The Dependence on Temperature and Current Density

C.-Y. Li, P. Borgesen, M.A. Korhonen

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    JournalApplied Physics Letters
    Volume61
    Publication statusPublished - 1992
    MoE publication typeA1 Journal article-refereed

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