Electrical compensation and cation vacancies in Al rich Si-doped AlGaN

I. Prozheev^*, F. Mehnke, T. Wernicke, M. Kneissl, F. Tuomisto

^*Corresponding author for this work

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CRYSTRAP: Charge traps in crystalline matter for future technologies
Tuomisto, F., Heikkinen, T., Vancraeyenest, A., Karjalainen, A. & Slotte, J.
01/09/2018 → 31/08/2019
Project: Academy of Finland: Other research funding