Effect of light induced change in built-in potential on carrier lifetime in epitaxial wafers

Hele Väinölä, Jan Storgårds, Marko Yli-Koski, Juha Sinkkonen

Research output: Working paperProfessional

Original languageEnglish
Publication statusPublished - 2001
MoE publication typeD4 Published development or research report or study

Publication series

NameDRIP IX, 9th International Conference on Defects -Recognition, Imaging and Physics in Semiconductors, Rimini, Italia, 24-28.9.2001
PublisherCesare Frigeri, CNR-MASPEC


  • built-in potential
  • carrier lifetime
  • epitaxial silicon
  • photoconduction

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