Abstract
The present study reveals that annealing Ag doped PbTe thin films enhance thermoelectric properties. Phase formation was identified by using X-ray diffraction measurement. Annealing increases the crystallinity of both undoped and Ag doped PbTe. Electrical resistivity and thermoelectric power measurements are done using four probe and bridge method respectively. The increase in thermoelectric power of Ag doped PbTe is 29 % in comparison to undoped PbTe and it further increases to 34 % after annealing at 250 o C for 1 hour whereas thermoelectric power increases by 14 % on annealing undoped PbTe thin films at same temperature.
Original language | English |
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Title of host publication | PROCEEDINGS OF THE 59TH DAE SOLID STATE PHYSICS SYMPOSIUM 2014 (SOLID STATE PHYSICS) |
Editors | R. Chitra, N. K. Sahoo, Dibyendu Bhattacharyya |
Publisher | American Institute of Physics |
Number of pages | 3 |
ISBN (Electronic) | 9780735413108 |
DOIs | |
Publication status | Published - 24 Jun 2015 |
MoE publication type | A4 Article in a conference publication |
Event | DAE Solid State Physics Symposium - Vellore, India Duration: 16 Dec 2014 → 20 Dec 2014 Conference number: 59 |
Publication series
Name | AIP Conference Proceedings |
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Volume | 1665 |
ISSN (Print) | 0094-243X |
ISSN (Electronic) | 1551-7616 |
Conference
Conference | DAE Solid State Physics Symposium |
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Abbreviated title | SSPS |
Country | India |
City | Vellore |
Period | 16/12/2014 → 20/12/2014 |
Keywords
- Thermoelectric material
- Thermoelectric power
- Electrical measuement
- X-Ray diffraction