Dynamical diffraction imaging of voids in nearly perfect silicon

T. Tuomi, R. Rantamäki, P.J. McNally, D. Lowney, A.N. Danilewsky, P. Becker

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)S. A133-A135
    JournalJournal of Physics D: Applied Physics
    Volume34
    Publication statusPublished - 2001
    MoE publication typeA1 Journal article-refereed

    Keywords

    • silicon
    • synchrotron x-ray topography
    • voids

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