Dynamical diffraction imaging of voids in extremely pure and perfect silicon

T. Tuomi, R. Rantamäki, P.J. McNally, D. Lowney, A.N. Danilewsky, Peter Becker

Research output: Working paper › Professional

Original language	English
Place of Publication	Hampuri
Pages	857-858
Publication status	Published - 2001
MoE publication type	D4 Published development or research report or study

Name	HASYLAB-DESY Annual Report, Part I

Keywords

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title = "Dynamical diffraction imaging of voids in extremely pure and perfect silicon",

keywords = "silicon, synchrotron topography, voids, silicon, synchrotron topography, voids, silicon, synchrotron topography, voids",

author = "T. Tuomi and R. Rantam{\"a}ki and P.J. McNally and D. Lowney and A.N. Danilewsky and Peter Becker",

year = "2001",

language = "English",

series = "HASYLAB-DESY Annual Report, Part I",

pages = "857--858",

type = "WorkingPaper",

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TY - UNPB

T1 - Dynamical diffraction imaging of voids in extremely pure and perfect silicon

AU - Tuomi, T.

AU - Rantamäki, R.

AU - McNally, P.J.

AU - Lowney, D.

AU - Danilewsky, A.N.

AU - Becker, Peter

PY - 2001

Y1 - 2001

KW - silicon

KW - synchrotron topography

KW - voids

KW - silicon

KW - synchrotron topography

KW - voids

KW - silicon

KW - synchrotron topography

KW - voids

M3 - Working paper

T3 - HASYLAB-DESY Annual Report, Part I

SP - 857

EP - 858

BT - Dynamical diffraction imaging of voids in extremely pure and perfect silicon

CY - Hampuri

ER -