Dynamical diffraction imaging of voids and precipitates in silicon using synchrotron radiation from an x-ray undulator

T. Tuomi, L. Knuuttila, Peter Becker, P.J. McNally, D. Lowney, A.N. Danilewsky

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationJyväskylä
    Pages271
    Publication statusPublished - 2001
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameXXXV Annual Conference of the Finnish Physical Society, Jyväskylä, Finland, March 22-24, 2001

    Keywords

    • precipitates
    • silicon
    • synchrotron topography

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