Dynamic element matching in digital-to-analog converters with code-dependent output resistance

Muhammad Siddique, Enrico Roverato, Marko Kosunen, Jussi Ryynänen

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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Abstract

This paper evaluates the pertormance ot dynamic element matching (DEM) in digital-to-analog-converters, when the unit conversion cells of the converter have finite output resistance. DEM is already known to be effective against the static amplitude, timing and pulse shaped mismatches. However, the effect of output resistance and its mismatches has not been studied. A comprehensive code-dependent output resistance model for the current-steering DAC is presented. System level simulations show that the non-linearity caused by the output resistance, in the absence of mismatches, is not shaped by the DEM encoder since the output resistance is same for all the conversion cells. In this paper we demonstrate that, in the presence of mismatches, the DEM encoder is able to shape the non-linearity they cause since the output resistance now varies among different conversion cells.
Original languageEnglish
Title of host publication2017 European Conference on Circuit Theory and Design (ECCTD)
PublisherIEEE
Number of pages4
ISBN (Electronic)978-1-5386-3974-0
ISBN (Print)978-1-5386-3975-7
DOIs
Publication statusPublished - 2 Nov 2017
MoE publication typeA4 Article in a conference publication
EventEuropean Conference on Circuit Theory and Design - Università degli Studi di Catania - Piazza Università, 2 - 95131 Catania, Catania, Italy
Duration: 4 Sep 20176 Sep 2017
Conference number: 23
http://www.ecctd2017.dieei.unict.it

Conference

ConferenceEuropean Conference on Circuit Theory and Design
Abbreviated titleECCTD
CountryItaly
CityCatania
Period04/09/201706/09/2017
Internet address

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