Dual-band submillimeter-wave kinetic inductance bolometers and an imaging system for contraband object detection

Juha Hassel, Shahab Oddin Dabironezare, Erio Gandini, Leif Grönberg, Hannu Sipola, Anssi Rautiainen, Aleksi Tamminen, Mikko Leivo, Hannu Lindström, Hannu Vasama, Arttu Luukanen, Nuria Llombart

Research output: Contribution to journalConference articleScientificpeer-review

2 Citations (Scopus)

Abstract

Kinetic inductance bolometer (KIB) technology is a candidate for scalable submillimeter wave imaging systems, particularly suitable for person security screening applications. We have previously shown that the basic figures of merit are compatible with room-temperature radiometric imaging applications, and demonstrated the functionality of kilo-pixel detector arrays. In this article, we report on our imaging system based on 8208 KIBs organized on a 2D focal plane. We provide an overview on the basic components, including the detectors, optics, and cryogenics, and describe aspects relevant in system integration. Moreover, we demonstrate the capacity in actual concealed object detection by presenting datasets revealing metallic and dielectric objects hidden under the clothes of a test person.

Original languageEnglish
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume10634
DOIs
Publication statusPublished - 1 Jan 2018
MoE publication typeA4 Article in a conference publication
EventPassive and Active Millimeter-Wave Imaging - Orlando, United States
Duration: 18 Apr 201819 Apr 2018
Conference number: 21

Keywords

  • Contraband detection
  • kinetic inductance
  • radiometry
  • submillimeter
  • superconductor
  • THz

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    Hassel, J., Dabironezare, S. O., Gandini, E., Grönberg, L., Sipola, H., Rautiainen, A., Tamminen, A., Leivo, M., Lindström, H., Vasama, H., Luukanen, A., & Llombart, N. (2018). Dual-band submillimeter-wave kinetic inductance bolometers and an imaging system for contraband object detection. Proceedings of SPIE - The International Society for Optical Engineering, 10634. https://doi.org/10.1117/12.2304722