Dry line on wire as advance indicator of product quality

Jouko Berndtson, A.J. Niemi

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication1996 Process & Product Quality Conference, Cincinnati, USA, October 14-17, 1996
    Place of PublicationTechnology Park, Atlanta, USA
    PublisherTAPPI Press
    Pages155-161
    Publication statusPublished - 1996
    MoE publication typeA4 Article in a conference publication

    Keywords

    • bump tests
    • CD control
    • dry line
    • edge detection
    • Fourdrinier paper machine
    • machine vision
    • MD control
    • wet end control

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