Double-shielded sample stage for single-electron devices

A.J. Manninen, A. Kemppinen, E. Mykkanen, H. Koivula, O. Hahtela, V.F. Maisi, S.V. Lotkhov, A.B. Zorin, O.-P. Saira, J.P. Pekola

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publication2012 Conference on Precision Electromagnetic Measurements, CPEM 2012, Washington, DC, 1 July 2012 - 6 July 2012
    Pages704-705
    Publication statusPublished - 2012
    MoE publication typeA4 Article in a conference publication

    Publication series

    Name
    ISSN (Print)0589-1485

    Keywords

    • charge pumps
    • Electromagnetic shielding
    • filtering
    • metrology
    • nanoscale devices
    • single electron devices

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