Distributions of waiting times of dynamic single-electron emitters

Mathias Albert*, Christian Flindt, Markus Büttiker

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

72 Citations (Scopus)


The distribution of waiting times between elementary tunneling events is of fundamental importance for understanding the stochastic charge transfer processes in nanoscale conductors. Here we investigate the waiting time distributions (WTDs) of periodically driven single-electron emitters and evaluate them for the specific example of a mesoscopic capacitor. We show that the WTDs provide a particularly informative characterization of periodically driven devices and we demonstrate how the WTDs allow us to reconstruct the full counting statistics (FCS) of charges that have been transferred after a large number of periods. We find that the WTDs are capable of describing short-time physics and correlations which are not accessible via the FCS alone.

Original languageEnglish
Article number086805
Pages (from-to)1-5
Number of pages5
JournalPhysical Review Letters
Issue number8
Publication statusPublished - 16 Aug 2011
MoE publication typeA1 Journal article-refereed


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