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We measure the full distribution of current fluctuations in a single-electron transistor with a controllable bistability. The conductance switches randomly between two levels due to the tunneling of single electrons in a separate single-electron box. The electrical fluctuations are detected over a wide range of time scales and excellent agreement with theoretical predictions is found. For long integration times, the distribution of the time-averaged current obeys the large-deviation principle. We formulate and verify a fluctuation relation for the bistable region of the current distribution.
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- 1 Finished
Golubev, D., Ronzani, A., Volovik, G., Westström, A., Tuoriniemi, J., Najafi Jabdaraghi, R. (., Pekola, J., Pöyhönen, K., Singh, S., Feshchenko, A., Kauppila, V., Senior, J., Viisanen, K., Wang, L., Khan, R., Padurariu, C. & Lähteenmäki, P.
01/01/2015 → 31/12/2017
Project: Academy of Finland: Other research funding