Dislocations at the interface between sapphire and GaN

Aapo Lankinen, Teemu Lang, Sami Suihkonen, Turkka Tuomi, M. Odnoblyudov, V. Bougrov, P.J. McNally, A.N. Danilewsky, P. Bergmsn, R. Simon

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationThe 6th International Conference on Materials for Microelectronics & Nanoengineering MFMN, 27-29.10.2006, Cranfield, UK
    Pages37-40
    Publication statusPublished - 2006
    MoE publication typeA4 Article in a conference publication

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