Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography

W.M. Chen, P.J. McNally, Uy.V. "Shvyd'ko", T. Tuomi, A.N. Danilewsky, M. Lerche

    Research output: Contribution to journalArticleScientificpeer-review

    12 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)113-119
    JournalJournal of Crystal Growth
    Issue number252
    Publication statusPublished - 2003
    MoE publication typeA1 Journal article-refereed

    Keywords

    • sapphire
    • synchrotron X-ray topography

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