Direct determination of electron mobility in photorefractive Bi 12SiO20 by a holographic time-of-flight technique

J. P. Partanen*, J. M C Jonathan, R. W. Hellwarth

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

41 Citations (Scopus)

Abstract

The time development of a photorefractive grating created by intersecting 30 ps (532 nm) beams in a well-characterized Bi12SiO 20 crystal (in a static field around 1 kV/cm) unambiguously reveals the mobility of photoexcited electrons to be 0.24±0.07 cm2/V s through what is essentially a "time-of-flight" measurement.

Original languageEnglish
Pages (from-to)2404-2406
Number of pages3
JournalApplied Physics Letters
Volume57
Issue number23
DOIs
Publication statusPublished - 1990
MoE publication typeA1 Journal article-refereed

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