Digital calibration certificate in metrology

Tuukka Mustapää*, Thomas Wiedenhöfer, Clifford Brown, Raine Viitala, Pekka Nikander, Petri Kuosmanen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Abstract

The current practices regarding traceability and handling of metrological data are lacking definitive standards that would allow a higher level of digitalization. The traceability of metrological instruments is verified with calibration certificates that are currently either paper documents or pdf files. This means that many of the processes where metrological data, such as calibration data, are handled still require human operations. EMPIR project SmartCom aims to define an Extensible Markup Language (XML) based structure for machine readable and processable digital calibration certificates and establish a framework, which allows unambiguous and secure handling and transfer of metrological data in Internet of Things (IoT) and cloud applications. Establishing this framework requires changes in the current practices especially in the areas of authentication and data security. Due to the significance of these changes, a lot of co-operation between institutions, companies and authorities in the field of metrology will be needed for successful global standardization of digital transfer of metrological data.

Original languageEnglish
Title of host publicationProceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2020
EditorsRichard K. Leach, David Billington, C. Nisbet, D. Phillips
Publishereuspen
Pages349-350
Number of pages2
ISBN (Electronic)9780995775176
Publication statusPublished - Jun 2020
MoE publication typeA4 Article in a conference publication
EventInternational Conference of the European Society for Precision Engineering and Nanotechnology - Virtual, Geneva, Austria
Duration: 8 Jun 202012 Jun 2020
Conference number: 20

Publication series

NameProceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2020

Conference

ConferenceInternational Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN
Country/TerritoryAustria
CityGeneva
Period08/06/202012/06/2020

Keywords

  • Calibration
  • Digital calibration certificate
  • Metrology
  • Traceability

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