Abstract
The current practices regarding traceability and handling of metrological data are lacking definitive standards that would allow a higher level of digitalization. The traceability of metrological instruments is verified with calibration certificates that are currently either paper documents or pdf files. This means that many of the processes where metrological data, such as calibration data, are handled still require human operations. EMPIR project SmartCom aims to define an Extensible Markup Language (XML) based structure for machine readable and processable digital calibration certificates and establish a framework, which allows unambiguous and secure handling and transfer of metrological data in Internet of Things (IoT) and cloud applications. Establishing this framework requires changes in the current practices especially in the areas of authentication and data security. Due to the significance of these changes, a lot of co-operation between institutions, companies and authorities in the field of metrology will be needed for successful global standardization of digital transfer of metrological data.
Original language | English |
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Title of host publication | Proceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2020 |
Editors | Richard K. Leach, David Billington, C. Nisbet, D. Phillips |
Publisher | euspen |
Pages | 349-350 |
Number of pages | 2 |
ISBN (Electronic) | 9780995775176 |
Publication status | Published - Jun 2020 |
MoE publication type | A4 Conference publication |
Event | International Conference of the European Society for Precision Engineering and Nanotechnology - Virtual, Geneva, Switzerland Duration: 8 Jun 2020 → 12 Jun 2020 Conference number: 20 |
Publication series
Name | Proceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2020 |
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Conference
Conference | International Conference of the European Society for Precision Engineering and Nanotechnology |
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Abbreviated title | EUSPEN |
Country/Territory | Switzerland |
City | Geneva |
Period | 08/06/2020 → 12/06/2020 |
Keywords
- Calibration
- Digital calibration certificate
- Metrology
- Traceability