Diagnostics of density fluctuations by enhanced scattering with frequency-tunable microwave sources

O. Dumbrajs, J. Heikkinen, K. Novik, A. Piliya, K. Sarparanta, S. Sipilä

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publication19th International Conference on Infrared and Millimeter Waves, Sendai, Japan, October 17-21, 1994.
PublisherThe Japan Society of Applied Physics
Pages315-316
Publication statusPublished - 1994
MoE publication typeA4 Article in a conference publication

Keywords

  • enhanced scattering
  • plasma diagnostics

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