Diagnosis of edge localized mode evolution in DIII-D using fast-gated CID and infrared cameras

M. Groth*, M. E. Fenstermacher, C. J. Lasnier, R. Hernandez, J. M. Moller, R. A. Sturz

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)

Abstract

Diagnosis of edge localized mode evolution in DIII-D was presented using fast-gated CID and infrared cameras. The emission during edge localized modes (ELM) were obtained. The divertor plasma in the model transiently detached with the arrival of the ELM particle pulse so that the CIII emission was expected to be around the X point.

Original languageEnglish
Pages (from-to)2064-2067
Number of pages4
JournalReview of Scientific Instruments
Volume74
Issue number3 II
DOIs
Publication statusPublished - Mar 2003
MoE publication typeA1 Journal article-refereed

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