Development of e-VLBI Technologies for Ultra-rapid UT1 Measurement

M. Sekido, T. Kondo, J. Wagner, T. Hobiger, K. Kokado, H. Takiguchi, Y. Koyama, R. Haas, J. Ritakari, S. Kurihara

Research output: Contribution to journalArticleProfessional

Original languageEnglish
Pages (from-to)28-30
JournalIVS NICT-Technology Development Center News
Issue number29
Publication statusPublished - 2008
MoE publication typeD1 Article in a trade journal

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