Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy

M. S. Dunaevskiy*, P. A. Alekseev, P. Geydt, E. Lahderanta, T. Haggren, H. Lipsanen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

Abstract

Abstract—A scanning probe microscopy method that allows one to measure Young’s modulus of thin and flexible nanowires is developed, which consists in measuring the deflection profiles under conditions of precise force control. This method can be applied to any thin and flexible one-dimensional or two-dimensional object. Using this approach, Young’s moduli of thin InP conical nanowires with the wurtzite and zincblende structures are measured. It is found that nanowires with the pure wurtzite structure have a higher value of Young’s modulus than the nanowires containing alternating wurtzite–zincblende phases.

Original languageEnglish
Pages (from-to)53-55
Number of pages3
JournalJournal of Surface Investigation
Volume13
Issue number1
DOIs
Publication statusPublished - 1 Jan 2019
MoE publication typeA1 Journal article-refereed

Keywords

  • scanning probe microscopy
  • semiconductor nanowires
  • wurtzite crystal structure
  • Young’s modulus

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