@inproceedings{5ecb5967953c4016b42aa0e307995ce2,
title = "Determination of thin film parameters from high accuracy measurements of spectral regular transmittance",
keywords = "characterization, complex index of refraction, thickness, thin film, characterization, complex index of refraction, thickness, thin film, characterization, complex index of refraction, thickness, thin film",
author = "Saulius Nevas and Farshid Manoocheri and Erkki Ikonen",
year = "2002",
language = "English",
pages = "78",
booktitle = "NEWRAD2002, Gaithersburg, USA, May 20-24, 2002",
}